Jun 19, 2025 (Thursday)
Time: 1:00 PM - 3:50 PM
Address: HNBK International Convention Center, Hall 201
Admission is free. Sign up & secure limited seats!
Time | Event |
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PM 1:00 ~ 1:15
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Welcome
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PM 1:15 ~ 1:20
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Opening
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PM 1:20 ~ 2:05
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Session 1 - USB Type-C & PD: EU RED and IEC 62368-1 Compliance Strategies |
PM 2:05 ~ 2:35
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Tea Break & Free Demo Time
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PM 2:35 ~ 3:20
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Session 2 - Precision measurement solutions for efficient SoC power design
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PM 3:20 ~ 3:35
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QA Time
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PM 3:35 ~ 3:50
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Lucky Draw
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Alan Chuang, GRL General Manager. Graduating from National Chiao Tung University with an M.S. in Electrophysics, Alan has over 20 years of practical experience in electronics, including B2B instrumentation testing and power product development. He has worked for Agilent (now Keysight) and RIGOL in the roles of application engineering, business development and regional sales.
Alan's presentation will introduce the application of USB Type-C features in public devices from a technical perspective; including fixed voltage, programmable power supply (PPS) and adjustable voltage supply (AVS) operation mechanisms. He will also discuss the latest EU IEC 62368-1 standard and EU RED Directive, sharing how GRL's testing solutions can accelerate the time-to-market process by performing functional safety verification, protocol compatibility testing and regulatory certification during product development.
Jason Hou, Application Engineer at Rohde & Schwarz, has more than five years of experience in hardware development, specializing in battery charging technology, in-vehicle battery management systems, and power supply design for consumer electronics products. He is responsible for oscilloscope measurement application, promotion, and technical support at Rohde & Schwarz in Taiwan, helping customers in the electronics industry with various measurement problems in product development.
In the high-performance SoC-driven era, power supply design has to meet the challenges of low voltage, high current and fast transients. Rohde & Schwarz's oscilloscopes provide high resolution, low noise, and deep memory to accurately analyze load transients, frequency response, and power sequencing; from dynamic voltage tuning to control loop validation. Explore how measurement techniques can help dynamic voltage regulation, control loop verification, improve multi-phase buck-conversion technology, and ultimately unlock the potential of SoCs.